Bruker

X-Ray Diffractometer (XRD)

Definitive crystal structure analysis and phase identification.

Genuine Product

1 Year Warranty

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Overview

The Bruker X-ray diffractometer provides precise phase identification, quantitative analysis, and crystal structure determination using Bragg-Brentano and parallel beam geometries. With a high-flux Cu Kα source, LynxEye detector, and automated sample changer, it delivers rapid, high-quality diffraction data for powder, thin-film, and polycrystalline sample analysis.

Key Capabilities

LynxEye 1D detector for ultra-fast data collection

Cu Kα radiation with Ni β-filter

Bragg-Brentano and parallel beam geometries

Automated 9-position sample changer

Rietveld refinement software included

Thin-film attachment with grazing incidence

Applications

Phase IdentificationQuantitative Phase AnalysisCrystal Structure DeterminationThin Film CharacterizationResidual Stress MeasurementCement & Minerals Analysis