Thermo Fisher
Field Emission SEM (FESEM)
Ultra-high resolution imaging for advanced materials characterization.
Genuine Product
1 Year Warranty
Expert Support
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Overview
The field-emission scanning electron microscope delivers sub-nanometer resolution imaging across a wide range of accelerating voltages. Equipped with in-lens and SE2 detectors, EDS elemental analysis, and EBSD crystallography, it provides comprehensive morphological and compositional characterization of metals, ceramics, polymers, biological tissues, and nanomaterials.
Key Capabilities
Resolution ≤ 1.0 nm at 15 kV
Accelerating voltage 0.1 – 30 kV
In-lens SE, SE2, and BSE detectors
Integrated EDS for elemental analysis
EBSD for crystallographic orientation
Variable pressure mode for non-conductive samples
Applications
Nanomaterial ImagingFailure AnalysisSemiconductor InspectionBattery & Fuel Cell ResearchGeological Sample AnalysisBiological & Medical Research
Technical Specifications
Resolution
≤ 1.0 nm at 15 kV
Magnification
20× – 2,000,000×
Accelerating Voltage
0.1 – 30 kV
Probe Current
1 pA – 200 nA
Chamber Size
340 mm diameter
Stage
5-axis motorized, eucentric
Warranty
1 Year Comprehensive
1 Year Warranty
Fast Support
ISO Certified
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