Bruker
Atomic Force Microscope (AFM)
Nanoscale surface imaging and property measurement.
Genuine Product
1 Year Warranty
Expert Support
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Overview
The atomic force microscope provides true nanometer-resolution 3D surface topography and property mapping. With tapping, contact, and PeakForce QNM modes, it simultaneously measures surface roughness, elastic modulus, adhesion, and electrical properties. The closed-loop scanner and vibration isolation platform ensure measurement repeatability for demanding nanoscale research.
Key Capabilities
Sub-nanometer vertical resolution
PeakForce QNM mechanical property mapping
Tapping, contact, and force spectroscopy modes
Closed-loop XYZ scanner for linearity
Integrated active vibration isolation
Conductive AFM and MFM capabilities
Applications
Nanomaterials ResearchThin Film AnalysisPolymer Surface CharacterizationSemiconductor MetrologyBiological ImagingEnergy Storage Materials
Technical Specifications
Z Resolution
< 0.03 nm
XY Resolution
< 1 nm
Scan Range
90 μm × 90 μm × 10 μm
Modes
Tapping, Contact, QNM, MFM
Sample Size
Up to 210 mm wafer
Connectivity
Ethernet, USB 3.0
Warranty
1 Year Comprehensive
1 Year Warranty
Fast Support
ISO Certified
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